Condition Monitoring of Rotating Diodes in Synchronous Machines Through the Exciter Stray Flux Analysis

  1. Tian, P.
  2. Guerrero, J.M.
  3. Platero, C.A.
  4. Lee, S.B.
  5. Gyftakis, K.N.
  6. Antonino-Daviu, J.
Revue:
IEEE Transactions on Industry Applications

ISSN: 1939-9367,  0093-9994

Année de publication: 2023

Volumen: 59

Número: 3

Pages: 3175-3185

Type: Communication dans un congrès

DOI: 10.1109/TIA.2023.3234934 GOOGLE SCHOLAR
La source de données: Scopus