Condition Monitoring of Rotating Diodes in Synchronous Machines Through the Exciter Stray Flux Analysis

  1. Tian, P.
  2. Guerrero, J.M.
  3. Platero, C.A.
  4. Lee, S.B.
  5. Gyftakis, K.N.
  6. Antonino-Daviu, J.
Journal:
IEEE Transactions on Industry Applications

ISSN: 1939-9367,  0093-9994

Year of publication: 2023

Volume: 59

Issue: 3

Pages: 3175-3185

Type: Conference paper

DOI: 10.1109/TIA.2023.3234934 GOOGLE SCHOLAR
Data source: Scopus