Variability management in embedded product line analysis
- Belategi, L.
- Sagardui, G.
- Etxeberria, L.
Actes de conférence:
Proceedings - 2nd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2010
ISBN: 9780769541464
Année de publication: 2010
Pages: 69-74
Type: Communication dans un congrès
