Variability management in embedded product line analysis

  1. Belategi, L.
  2. Sagardui, G.
  3. Etxeberria, L.
Proceedings:
Proceedings - 2nd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2010

ISBN: 9780769541464

Year of publication: 2010

Pages: 69-74

Type: Conference paper

DOI: 10.1109/VALID.2010.16 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus