Analytical identification of the calibration matrices using the two plane model

  1. Izaguirre, A.
  2. Pu, P.
  3. Summers, J.
Revue:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 1996-756X,  0277-786X

Année de publication: 1986

Volumen: 635

Pages: 327-332

Type: Article

DOI: 10.1117/12.964146 GOOGLE SCHOLAR
La source de données: Scopus