Analytical identification of the calibration matrices using the two plane model

  1. Izaguirre, A.
  2. Pu, P.
  3. Summers, J.
Aldizkaria:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 1996-756X 0277-786X

Argitalpen urtea: 1986

Alea: 635

Orrialdeak: 327-332

Mota: Artikulua

DOI: 10.1117/12.964146 GOOGLE SCHOLAR