Multi-Metrics Approach for Security, Privacy and Dependability in Embedded Systems
- Garitano, I.
- Fayyad, S.
- Noll, J.
ISSN: 1572-834X, 0929-6212
Année de publication: 2015
Volumen: 81
Número: 4
Pages: 1359-1376
Type: Article
Revue:
Wireless Personal Communications
