University of Parma-ko ikertzaileekin lankidetzan egindako argitalpenak (2)

2020

  1. A method to extract lumped thermal networks of capacitors for reliability oriented design

    Microelectronics Reliability, Vol. 114

  2. A methodology to determine the effect of a novel modulation in the reliability of an automotive DC-link capacitor

    IEEE Access, Vol. 8, pp. 192713-192726