Deflectometric data segmentation for surface inspection: A fully convolutional neural network approach

  1. Maestro-Watson, D.
  2. Balzategui, J.
  3. Eciolaza, L.
  4. Arana-Arexolaleiba, N.
Journal:
Journal of Electronic Imaging

ISSN: 1560-229X,  1017-9909

Year of publication: 2020

Volume: 29

Issue: 4

Type: Article

DOI: 10.1117/1.JEI.29.4.041007 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus