Publicacions en què col·labora amb Luka Eciolaza Echeverria (4)

2021

  1. Anomaly detection and automatic labeling for solar cell quality inspection based on generative adversarial network

    Sensors, Vol. 21, Núm. 13

2020

  1. Deflectometric data segmentation for surface inspection: A fully convolutional neural network approach

    Journal of Electronic Imaging, Vol. 29, Núm. 4

2019

  1. Deep Learning for Deflectometric Inspection of Specular Surfaces

    Advances in Intelligent Systems and Computing

  2. Deflectometric data segmentation based on fully convolutional neural networks

    Proceedings of SPIE - The International Society for Optical Engineering