Publicaciones (48) Publicaciones de Luka Eciolaza Echeverria

2020

  1. ADAPT: An Automatic Diagnosis of Activity and Processes in auTomation environments

    IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

  2. Defect detection on Polycrystalline solar cells using Electroluminescence and Fully Convolutional Neural Networks

    Proceedings of the 2020 IEEE/SICE International Symposium on System Integration, SII 2020

  3. Deflectometric data segmentation for surface inspection: A fully convolutional neural network approach

    Journal of Electronic Imaging, Vol. 29, Núm. 4

  4. Torque-based methodology and experimental implementation for industrial robot standby pose optimization

    International Journal of Advanced Manufacturing Technology, Vol. 111, Núm. 7-8, pp. 2065-2072

2019

  1. Deep Learning for Deflectometric Inspection of Specular Surfaces

    Advances in Intelligent Systems and Computing

  2. Deflectometric data segmentation based on fully convolutional neural networks

    Proceedings of SPIE - The International Society for Optical Engineering

  3. Fuzzy control systems: Past, present and future

    IEEE Computational Intelligence Magazine, Vol. 14, Núm. 1, pp. 56-68

  4. Performance degradation monitoring and quantification: A wastewater treatment plant case study

    Predictive Maintenance in Dynamic Systems: Advanced Methods, Decision Support Tools and Real-World Applications (Springer International Publishing), pp. 381-401

  5. Semi-automatic quality inspection of solar cell based on Convolutional Neural Networks

    IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

  6. Towards cognitive cities in the energy domain

    Studies in Systems, Decision and Control (Springer International Publishing), pp. 155-183

  7. Virtual commissioning of a robotic cell: An educational case study

    IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

2017

  1. Spot Welding Monitoring System based on Fuzzy Classification and Deep Learning

    2017 IEEE INTERNATIONAL CONFERENCE ON FUZZY SYSTEMS (FUZZ-IEEE)