Publications dans lesquelles il/elle collabore avec Luka Eciolaza Echeverria (7)

2023

  1. Few-shot incremental learning in the context of solar cell quality inspection

    Expert Systems with Applications, Vol. 228

2021

  1. Anomaly detection and automatic labeling for solar cell quality inspection based on generative adversarial network

    Sensors, Vol. 21, Núm. 13

2020

  1. Defect detection on Polycrystalline solar cells using Electroluminescence and Fully Convolutional Neural Networks

    Proceedings of the 2020 IEEE/SICE International Symposium on System Integration, SII 2020

  2. Deflectometric data segmentation for surface inspection: A fully convolutional neural network approach

    Journal of Electronic Imaging, Vol. 29, Núm. 4

2019

  1. Deep Learning for Deflectometric Inspection of Specular Surfaces

    Advances in Intelligent Systems and Computing

  2. Deflectometric data segmentation based on fully convolutional neural networks

    Proceedings of SPIE - The International Society for Optical Engineering

  3. Semi-automatic quality inspection of solar cell based on Convolutional Neural Networks

    IEEE International Conference on Emerging Technologies and Factory Automation, ETFA