How Do Deep Learning Faults Affect AI-Enabled Cyber-Physical Systems in Operation? A Preliminary Study Based on DeepCrime Mutation Operators
- Arrieta, A.
- Valle, P.
- Iriarte, A.
- Illarramendi, M.
ISSN: 1949-3789, 1949-3770
ISBN: 9781665452236
Datum der Publikation: 2023
2023 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement, ESEM 2023
Art: Konferenz-Beitrag