Novel Analytical Method for Estimating the Junction-to-Top Thermal Resistance of Power MOSFETs
- Sanz-Alcaine, J.M.
- Perez-Cebolla, F.J.
- Bernal-Ruiz, C.
- Arruti, A.
- Aizpuru, I.
Konferenzberichte:
24th European Conference on Power Electronics and Applications, EPE 2022 ECCE Europe
ISBN: 9789075815399
Datum der Publikation: 2022
Art: Konferenz-Beitrag