A method to extract lumped thermal networks of capacitors for reliability oriented design
- Delmonte, N.
- Cabezuelo, D.
- Kortabarria, I.
- Santoro, D.
- Toscani, A.
- Cova, P.
Aldizkaria:
Microelectronics Reliability
ISSN: 0026-2714
Argitalpen urtea: 2020
Alea: 114
Mota: Artikulua